A low leakage retention LDO and leakage-based BGR with 120nA quiescent current

  • Behnam Samadpoor Rikan
  • , Hamed Abbasizadeh
  • , Truong Thi Kim Nga
  • , Sung Jin Kim
  • , Kang Yoon Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper proposes a low leakage (LL) Low-Dropout (LDO) regulator. To reduce the power consumption and skip the requirement of BJT transistors a leakage-based Bandgap Reference (BGR) is applied in this structure. To reduce the current consumption, the devices in this structure are designed to operate in sub-threshold regions. The proposed LL LDO is verified in a 55-nm CMOS process with a 0.11-mm2 active area. The quiescent current of this structure is 120nA from a 3.3 V supply voltage.

Original languageEnglish
Title of host publicationProceedings - International SoC Design Conference 2017, ISOCC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages200-201
Number of pages2
ISBN (Electronic)9781538622858
DOIs
StatePublished - 29 May 2018
Event14th International SoC Design Conference, ISOCC 2017 - Seoul, Korea, Republic of
Duration: 5 Nov 20178 Nov 2017

Publication series

NameProceedings - International SoC Design Conference 2017, ISOCC 2017

Conference

Conference14th International SoC Design Conference, ISOCC 2017
Country/TerritoryKorea, Republic of
CitySeoul
Period5/11/178/11/17

Keywords

  • Bandgap reference
  • Low dropout regulator
  • Low leakage
  • Quiescent current
  • Ultra-low power

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