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A fluorite-structured HfO2/ZrO2/HfO2 superlattice based self-rectifying ferroelectric tunnel junction synapse

  • Dong Hyun Lee
  • , Ji Eun Kim
  • , Yong Hyeon Cho
  • , Sojin Kim
  • , Geun Hyeong Park
  • , Hyojun Choi
  • , Sun Young Lee
  • , Taegyu Kwon
  • , Da Hyun Kim
  • , Moonseek Jeong
  • , Hyun Woo Jeong
  • , Younghwan Lee
  • , Seung Yong Lee
  • , Jung Ho Yoon
  • , Min Hyuk Park
  • Seoul National University
  • Korea Institute of Science and Technology
  • Hanyang University
  • Chonnam National University

Research output: Contribution to journal › Article › peer-review

Abstract

A self-rectifying ferroelectric tunnel junction that employs a HfO2/ZrO2/HfO2 superlattice (HZH SL) combined with Al2O3 and TiO2 layers is proposed. The 6 nm-thick HZH SL effectively suppresses the formation of non-ferroelectric phases while increasing remnant polarization (Pr). This enlarged Pr modulates the energy barrier configuration, consequently achieving a large on/off ratio of 1273 by altering the conduction mechanism from off-state thermal injection to on-state Fowler-Nordheim tunneling. Moreover, the asymmetric Schottky barriers at the top TiN/TiO2 and bottom HfO2/Pt interfaces enable a self-rectifying property with a rectifying ratio of 1550. Through calculations and simulations it is found that the device demonstrates potential for achieving an integrated array size exceeding 7k while maintaining a 10% read margin, and shows potential for application in artificial synapses for neuromorphic computing with an image recognition accuracy above 92%. Finally, the self-rectifying behavior and device-to-device variation reliability are confirmed in a 9 × 9 crossbar array structure.

Original languageEnglish
Pages (from-to)5251-5264
Number of pages14
JournalMaterials Horizons
Volume11
Issue number21
DOIs
StatePublished - 26 Sep 2024

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