Abstract
A supportive CAD tool that can produce an optimum finite element model for TFT-LCD assembly of lap-top PCs was provided and the procedure of impact simulation was also proposed. Integrated CAE system that can accurately evaluate impact damage was developed. It was found that the impact damage of TFT-LCD assembly can be evaluated rapidly and exactly for the specific design change. It was expected that LIAS can be used to maximize the efficiency for the failure free design of TFT-LCD assembly.
| Original language | English |
|---|---|
| Pages (from-to) | 1773-1778 |
| Number of pages | 6 |
| Journal | Key Engineering Materials |
| Volume | 270-273 |
| Issue number | III |
| State | Published - 2004 |
| Event | Proceedings of the 11th Asian Pacific Conference on Nondestructive Testing - Jeju Island, Korea, Republic of Duration: 3 Nov 2003 → 7 Nov 2003 |
Keywords
- Lagrangian FE
- Mechanical Shock Failure
- Optimization
- TFT-LCD