A 0.75-3.0-Gb/s Dual-Mode Temperature-Tolerant Referenceless CDR with a Deadzone-Compensated Frequency Detector

  • Jahoon Jin
  • , Xuefan Jin
  • , Jaehong Jung
  • , Kiwon Kwon
  • , Jintae Kim
  • , Jung Hoon Chun

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

This paper proposes a 750-Mb/s to 3.0-Gb/s dual-mode (full and half rate) referenceless clock and data recovery (CDR) circuit in a 65-nm CMOS process. The dual-mode deadzone-compensated frequency detector (DC-FD) and the digital calibration of both bank and control voltage of voltage-controlled oscillators (VCOs) allow precise frequency acquisition even with high input jitter. The dual-mode scheme extends supported data rates, and the temperature compensation technique allows uninterrupted video transmission with a bit error rate (BER) below 10-12 over a wide temperature range from-20 °C to 120 °C.

Original languageEnglish
Article number8425749
Pages (from-to)2994-3003
Number of pages10
JournalIEEE Journal of Solid-State Circuits
Volume53
Issue number10
DOIs
StatePublished - Oct 2018

Keywords

  • Clock and data recovery (CDR)
  • deadzone compensation
  • dual-mode
  • frequency acquisition
  • jitter tolerance (JTOL)
  • referenceless
  • temperature compensation

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