45pW ESD clamp circuit for ultra-low power applications

Yen Po Chen; Yoonmyung Lee; Jae Yoon Sim; Massimo Alioto; David Blaauw; Dennis Sylvester

doi:10.1109/CICC.2013.6658522

45pW ESD clamp circuit for ultra-low power applications

Yen Po Chen, Yoonmyung Lee, Jae Yoon Sim, Massimo Alioto, David Blaauw, Dennis Sylvester

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Scopus citations

Abstract

Novel ultra low-leakage ESD power clamp designs for wireless sensor applications are proposed and implemented in 0.18μm CMOS. Using new biasing structures to limit both subthreshold leakage and GIDL, the proposed designs consume as little as 43pW at 25̊C and 119nW at 125̊C with 4500V HBM level and 400V MM level protection, marking an 18-139× leakage reduction over conventional ESD clamps.

Original language	English
Title of host publication	Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Print)	9781467361460
DOIs	https://doi.org/10.1109/CICC.2013.6658522
State	Published - 7 Nov 2013
Externally published	Yes
Event	35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013 - San Jose, CA, United States Duration: 22 Sep 2013 → 25 Sep 2013

Publication series

Name	Proceedings of the Custom Integrated Circuits Conference
ISSN (Print)	0886-5930

Conference

Conference	35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013
Country/Territory	United States
City	San Jose, CA
Period	22/09/13 → 25/09/13

Access to Document

10.1109/CICC.2013.6658522

Cite this

Chen, Y. P., Lee, Y., Sim, J. Y., Alioto, M., Blaauw, D., & Sylvester, D. (2013). 45pW ESD clamp circuit for ultra-low power applications. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013 Article 6658522 (Proceedings of the Custom Integrated Circuits Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CICC.2013.6658522

@inproceedings{760c1f9ab4cd4168b9896d6d38d940b6,

title = "45pW ESD clamp circuit for ultra-low power applications",

abstract = "Novel ultra low-leakage ESD power clamp designs for wireless sensor applications are proposed and implemented in 0.18μm CMOS. Using new biasing structures to limit both subthreshold leakage and GIDL, the proposed designs consume as little as 43pW at 25̊C and 119nW at 125̊C with 4500V HBM level and 400V MM level protection, marking an 18-139× leakage reduction over conventional ESD clamps.",

author = "Chen, \{Yen Po\} and Yoonmyung Lee and Sim, \{Jae Yoon\} and Massimo Alioto and David Blaauw and Dennis Sylvester",

year = "2013",

month = nov,

day = "7",

doi = "10.1109/CICC.2013.6658522",

language = "English",

isbn = "9781467361460",

series = "Proceedings of the Custom Integrated Circuits Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013",

note = "35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013 ; Conference date: 22-09-2013 Through 25-09-2013",

}

Chen, YP, Lee, Y, Sim, JY, Alioto, M, Blaauw, D & Sylvester, D 2013, 45pW ESD clamp circuit for ultra-low power applications. in Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013., 6658522, Proceedings of the Custom Integrated Circuits Conference, Institute of Electrical and Electronics Engineers Inc., 35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013, San Jose, CA, United States, 22/09/13. https://doi.org/10.1109/CICC.2013.6658522

45pW ESD clamp circuit for ultra-low power applications. / Chen, Yen Po; Lee, Yoonmyung; Sim, Jae Yoon et al.
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013. Institute of Electrical and Electronics Engineers Inc., 2013. 6658522 (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - 45pW ESD clamp circuit for ultra-low power applications

AU - Chen, Yen Po

AU - Lee, Yoonmyung

AU - Sim, Jae Yoon

AU - Alioto, Massimo

AU - Blaauw, David

AU - Sylvester, Dennis

PY - 2013/11/7

Y1 - 2013/11/7

N2 - Novel ultra low-leakage ESD power clamp designs for wireless sensor applications are proposed and implemented in 0.18μm CMOS. Using new biasing structures to limit both subthreshold leakage and GIDL, the proposed designs consume as little as 43pW at 25̊C and 119nW at 125̊C with 4500V HBM level and 400V MM level protection, marking an 18-139× leakage reduction over conventional ESD clamps.

AB - Novel ultra low-leakage ESD power clamp designs for wireless sensor applications are proposed and implemented in 0.18μm CMOS. Using new biasing structures to limit both subthreshold leakage and GIDL, the proposed designs consume as little as 43pW at 25̊C and 119nW at 125̊C with 4500V HBM level and 400V MM level protection, marking an 18-139× leakage reduction over conventional ESD clamps.

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U2 - 10.1109/CICC.2013.6658522

DO - 10.1109/CICC.2013.6658522

M3 - Conference contribution

AN - SCOPUS:84892658070

SN - 9781467361460

T3 - Proceedings of the Custom Integrated Circuits Conference

BT - Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, CICC 2013

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 35th Annual Custom Integrated Circuits Conference - The Showcase for Circuit Design in the Heart of Silicon Valley, CICC 2013

Y2 - 22 September 2013 through 25 September 2013

ER -

45pW ESD clamp circuit for ultra-low power applications

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