Research output per year
Research output per year
Personal profile
Education
(B.S) Electrical Engineering, Sungkyunkwan University, Suwon, Korea, 2004.02
(Ph.D) Electrical Engineering, Seoul National University, Seoul, Korea, 2009.08
Professional Experience
Senior Engineer, Semiconductor R&D Center, Samsung Electronics, 2009.09-2016.02.
Principal Engineer, Semiconductor R&D Center, Samsung Electronics, 2016.03-2017.08.
Assistant Professor, Konkuk University, 2017.09-2021.08
Associate Professor, Konkuk University, 2021.09-2023.08
Associate Professor, SungkyunKwan University, 2023.09-
Fingerprint
Dive into the research topics where Jong Wuk Jun is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
-
A Comparative Analysis of Middle-of-Line Contact Architectures for Complementary FETs
Kyu Kim, S., Kim, J., Choi, G., Kwon, K. W. & Jeon, J., 2025, In: IEEE Access. 13, p. 5396-5405 10 p.Research output: Contribution to journal › Article › peer-review
Open Access7 Scopus citations -
Area-Adjusted Comparison of BSPDN Interconnects in CFET: Superiority of Frontside Connection
Lee, J., Kim, S. K., Lee, K. Y. & Jeon, J., 2025, In: IEEE Transactions on Electron Devices. 72, 11, p. 6329-6335 7 p.Research output: Contribution to journal › Article › peer-review
-
Enhanced programming efficiency in vertical NAND flash using self-boosting hot carrier injection
Kim, M., Hong, J., Kim, C., Kim, S. J., Hwang, S., Baik, S. J. & Jeon, J., Dec 2025, In: Scientific Reports. 15, 1, 35904.Research output: Contribution to journal › Article › peer-review
Open Access -
Enhancing memory performance in IGZO-based 2T0C DRAM through comparative analysis of CAA and GAA FET structures
Kim, M., Lee, J., Cho, H. & Jeon, J., Dec 2025, In: Journal of Computational Electronics. 24, 6, 190.Research output: Contribution to journal › Article › peer-review
-
Exploring optimal TMDC multi-channel GAA-FET architectures at sub-1nm nodes
Lee, J., Jung, H., Jin, D. & Jeon, J., Sep 2025, In: Journal of Science: Advanced Materials and Devices. 10, 3, 100931.Research output: Contribution to journal › Article › peer-review
Open Access