Personal profile
Education
(2011) 공학박사, 포항공과대학교 산업경영공학과
(2006) 공학사, 포항공과대학교 산업경영공학과
Professional Experience
한양대학교 산업융합학부, 조교수, 부교수
삼성전자 파운드리사업부 품질팀, 책임연구원
Awards
(2018) 제28회 과학기술우수논문상 수상 (수여기관: 한국과학기술단체총연합회)
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Dive into the research topics where Donghee Lee is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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A framework for detecting unknown defect patterns on wafer bin maps using active learning
Shin, J. S., Kim, M. J. & Lee, D. H., 15 Jan 2025, In: Expert Systems with Applications. 260, 125378.Research output: Contribution to journal › Article › peer-review
22 Link opens in a new tab Scopus citations -
A Model Predictive Control-Based Scheduling for Optimizing both Quality and Productivity in Multistage Manufacturing Process
Lee, S. & Lee, D. H., 2025, 2025 IEEE 21st International Conference on Automation Science and Engineering, CASE 2025. IEEE Computer Society, p. 1179-1183 5 p. (IEEE International Conference on Automation Science and Engineering).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Automated Classification and Captioning for Wafer Bin Map Using Attention-based Image Captioning Approach
Kim, B. S., Shin, J. S. & Lee, D. H., 2025, 2025 IEEE 21st International Conference on Automation Science and Engineering, CASE 2025. IEEE Computer Society, p. 1189-1194 6 p. (IEEE International Conference on Automation Science and Engineering).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Cost-Stability Evaluation Framework for Reliable Deployment of Object Detectors in Industrial Applications
Lee, K., Hong, J., Kim, B. S., Song, Y. & Lee, D. H., 2025, In: IEEE Access. 13, p. 207566-207580 15 p.Research output: Contribution to journal › Article › peer-review
Open Access1 Link opens in a new tab Scopus citations -
Development of a suspiciousness measure with reduced redundancy for screening machine sets in serial-parallel multistage manufacturing processes
Choi, S. H., Lee, D. H., Bae, Y. M. & Kim, K. J., 15 Apr 2025, In: Expert Systems with Applications. 269, 126480.Research output: Contribution to journal › Article › peer-review
1 Link opens in a new tab Scopus citations
Press/Media
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Detecting Unknown Defects in Semiconductor Manufacturing Processes Using Artificial Intelligence
12/12/25
1 Media contribution
Press/Media