Research output per year
Research output per year
Personal profile
Education
(2011) 공학박사, 포항공과대학교 산업경영공학과
(2006) 공학사, 포항공과대학교 산업경영공학과
Professional Experience
한양대학교 산업융합학부, 조교수, 부교수
삼성전자 파운드리사업부 품질팀, 책임연구원
Awards
(2018) 제28회 과학기술우수논문상 수상 (수여기관: 한국과학기술단체총연합회)
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Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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A framework for detecting unknown defect patterns on wafer bin maps using active learning
Shin, J. S., Kim, M. J. & Lee, D. H., 15 Jan 2025, In: Expert Systems with Applications. 260, 125378.Research output: Contribution to journal › Article › peer-review
14 Scopus citations -
A Model Predictive Control-Based Scheduling for Optimizing both Quality and Productivity in Multistage Manufacturing Process
Lee, S. & Lee, D. H., 2025, 2025 IEEE 21st International Conference on Automation Science and Engineering, CASE 2025. IEEE Computer Society, p. 1179-1183 5 p. (IEEE International Conference on Automation Science and Engineering).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Automated Classification and Captioning for Wafer Bin Map Using Attention-based Image Captioning Approach
Kim, B. S., Shin, J. S. & Lee, D. H., 2025, 2025 IEEE 21st International Conference on Automation Science and Engineering, CASE 2025. IEEE Computer Society, p. 1189-1194 6 p. (IEEE International Conference on Automation Science and Engineering).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Development of a suspiciousness measure with reduced redundancy for screening machine sets in serial-parallel multistage manufacturing processes
Choi, S. H., Lee, D. H., Bae, Y. M. & Kim, K. J., 15 Apr 2025, In: Expert Systems with Applications. 269, 126480.Research output: Contribution to journal › Article › peer-review
1 Scopus citations -
Edge Computing-Based Digital Twin Framework Based on ISO 23247 for Enhancing Data Processing Capabilities
Kang, M. S., Lee, D. H., Bajestani, M. S., Kim, D. B. & Noh, S. D., Jan 2025, In: Machines. 13, 1, 19.Research output: Contribution to journal › Article › peer-review
Open Access15 Scopus citations
Press/Media
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Detecting Unknown Defects in Semiconductor Manufacturing Processes Using Artificial Intelligence
12/12/25
1 Media contribution
Press/Media