Personal profile
Education
(Ph.D.) Seoul National University, School of Computer Engineering (2000 ~ 2004)
(Ph.D.) 서울대학교 컴퓨터공학부 (2000 ~ 2004)
Professional Experience
Samsung Electronics, Senior Engineer (2004 ~ 2007)
삼성전자 책임연구원(2004 ~ 2007)
성균관대학교 조교수/부교수(2007 ~ )
성균관대학교 정보통신대학원 컴퓨터공학과/정보보호학과 주임교수(2009 ~ 2011)
성균관대학교 일반대학원 임베디드소프트웨어학과 학과장(2011 ~ 2014)
삼성전자 메모리사업부 자문교수(2013 ~ 2014)
정보과학회 논문지 편집위원(2013 ~ )
성균관대학교 컴퓨터공학과 학과장(2015 ~ )
Awards
제 10회 삼성휴먼테크 논문상 은상 (2004)
성균관대학교 정보통신기술연구소 우수연구자상 (2012)
성균관대학교 정보통신기술연구소 우수연구자상 (2013)
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Collaborations and top research areas from the last five years
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An Integer-Only Quantized Transformer with LayerNorm Removal and Linear Attention for Efficient MCU Deployment in TinyML Applications
Pyo, J. & Shin, D., 2025, 2025 International Technical Conference on Circuits/Systems, Computers, and Communications, ITC-CSCC 2025. Institute of Electrical and Electronics Engineers Inc., (2025 International Technical Conference on Circuits/Systems, Computers, and Communications, ITC-CSCC 2025).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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D2FS: Device-Driven Filesystem Garbage Collection
Kim, J., Lee, S., Oh, J., Shin, D. & Won, Y., 2025, Proceedings of the 23rd USENIX Conference on File and Storage Technologies, FAST 2025. USENIX Association, p. 337-353 17 p. (Proceedings of the 23rd USENIX Conference on File and Storage Technologies, FAST 2025).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
3 Link opens in a new tab Scopus citations -
Mitigating Write Buffer Thrashing in Zoned UFS with a Dedicated fsync Stream
Jeong, J. & Shin, D., 2025, 2025 International Technical Conference on Circuits/Systems, Computers, and Communications, ITC-CSCC 2025. Institute of Electrical and Electronics Engineers Inc., (2025 International Technical Conference on Circuits/Systems, Computers, and Communications, ITC-CSCC 2025).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Precision Matching Optimization of Optical Metrology and Inspection Equipment for Yield Enhancement in Semiconductor Manufacturing
Shin, H., Lee, H. & Shin, D., 2025, In: Journal of Semiconductor Technology and Science. 25, 6, p. 623-632 10 p.Research output: Contribution to journal › Article › peer-review
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Delayed TRIM for Reducing Trim Overhead
Kim, J. & Shin, D., 2024, Proceedings - 2024 13th IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA 2024. Institute of Electrical and Electronics Engineers Inc., (Proceedings - 2024 13th IEEE Non-Volatile Memory Systems and Applications Symposium, NVMSA 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review