Ultra High Resolution AFM(Atomic Force Microscope)

Cypher S is a high-speed, high-resolution atomic force microscope (AFM) developed by Oxford Instruments Asylum Research. It enables advanced nanoscale imaging and measurement in both air and liquid environments, supporting cutting-edge research in materials science and life sciences. Key Features: High-speed scanning (10–100× faster than conventional AFMs) Ultra-high resolution imaging Extremely low electrical noise and mechanical drift Integrated automated operation tools Modular upgrade options for environmental control and video-rate imaging Applications: Nanomaterials and thin film characterization Mechanical property analysis at the nanoscale Surface inspection in semiconductor and electronics research