Profiler

The Dektak XT is a stylus profilometer developed by Bruker for high-precision surface measurements. It is widely used in research and industry for analyzing thin films, step heights, roughness, and surface texture. Key Features of Dektak XT: High Vertical Resolution – Measures step heights down to sub-nanometer levels. Stylus-Based Contact Profilometry – Uses a mechanical stylus to scan surfaces with high precision. Fast and Accurate Measurements – Provides high-speed data acquisition with minimal noise. Automated Analysis – Supports programmable measurements for repeatability. Wide Application Range – Suitable for different materials, from soft polymers to hard coatings. Applications: Semiconductor Industry – Measuring thin film thickness and surface roughness. Material Science – Characterizing coatings and microstructures. Optics & Photonics – Evaluating surface profiles of optical components.