High Power Thin Film X-Ray Diffractometer System

The D8 ADVANCE is a high-performance X-ray diffraction (XRD) system developed by Bruker for material analysis. It is widely used in research and industry for studying the crystalline structure of materials. We are using this machine for Thin Film Analysis. Key Features of D8 ADVANCE: High Precision XRD Analysis – Provides detailed information about crystal structures, phases, and orientations. Modular Design – Allows customization with different X-ray sources, detectors, and sample stages. High-Speed Data Acquisition – Enables fast and accurate measurements. Non-Destructive Testing – Suitable for analyzing delicate samples without damage. Flexible Measurement Modes – Supports powder diffraction, thin film analysis, texture analysis, and stress/strain measurements. Applications: Materials Science – Characterization of metals, ceramics, and polymers. Pharmaceuticals – Identifying crystalline phases in drug formulations. Geology & Mining – Analyzing minerals and ores. Semiconductor Industry – Investigating thin films and coatings.