Equipments Details
Description
The JEOL NEOARM (JEM-ARM200F) is a state-of-the-art atomic-resolution analytical transmission electron microscope (TEM) designed for advanced materials characterization.
Key Features:
Cold Field Emission Gun (Cold FEG)
Advanced Spherical Aberration Corrector (ASCOR)
Automated Aberration Correction System (JEOL COSMO™)
Enhanced STEM Detector
Applications:
Materials Science: For detailed analysis of nanostructures, defects, and interfaces in advanced materials.
Semiconductor Research: To examine device structures and materials at the atomic level.
Nanotechnology: For characterizing nanomaterials and understanding their properties.
Biological Research: To study biological specimens with high spatial resolution.
Details
| Name | TEM 5 |
|---|---|
| Acquisition date | 25/02/25 |
| Manufacturers | JEOL |
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