Field Emission Scanning Electron Microscope 4 (EDS)

  • Jaehyun Park (Manager)

Equipment/facility: Equipment

    Equipments Details

    Description

    A field emission SEM based on JEOL JSM-7600F, featuring an in-lens FEG system and auto-focus adjustment for high-resolution imaging.

    Details

    NameSEM 4
    Acquisition date1/04/11
    ManufacturersJEOL

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