Cryo Laser-assisted Local Electrode Atom Probe

The LEAP 6000 XR is a state-of-the-art 3D atom probe developed by CAMECA, designed for high-resolution atomic-scale imaging and compositional analysis. It combines voltage and deep ultraviolet (DUV) laser pulsing to enhance data quality and yield, making it ideal for advanced materials research. Key Features: Simultaneous voltage and DUV laser pulsing for improved sensitivity and data quality​ Enhanced automation with advanced vision systems for precise alignment​ Compatibility with microtip arrays and redesigned optics for ease of use​ Low spectral background enabling more accurate reconstructions​ Fully automated operation capabilities for high-throughput analysis​ Applications: Atomic-scale analysis of metals, semiconductors, ceramics, and oxides​ Investigation of grain boundaries and interfaces in advanced materials​ Characterization of dopant distributions in semiconductor devices​ Research in energy materials, including batteries and fuel cells​ Studies in geoscience and biomineralization processes